Micrometer-resolution imaging using MÖNCH: towards G2-less grating interferometry
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- 作者：Sebastian Cartier ; Matias Kagias ; Anna Bergamaschi ; Zhentian Wang ; Roberto Dinapoli ; Aldo Mozzanica ; Marco Ramilli ; Bernd Schmitt ; Martin Brü ; ckner ; Erik Frö ; jdh ; Dominic Greiffenberg ; Davit Mayilyan ; Davide Mezza ; Sophie Redford ; Christian Ruder ; Lukas Schä ; dler ; Xintian Shi ; Dhanya Thattil ; Gemma Tinti ; Jiaguo Zhang and Marco Stampanoni
- 关键词：hybrid detectors ; silicon detectors ; interpolation ; grating interferometry
- 刊名：Journal of Synchrotron Radiation
- 出版年：2016
- 出版时间：November 2016
- 年：2016
- 卷：23
- 期：6
- 页码：1462-1473
- 全文大小：1337K
- ISSN：1600-5775
文摘
MÖNCH is a 25 µm-pitch charge-integrating detector aimed at exploring the limits of current hybrid silicon detector technology. The small pixel size makes it ideal for high-resolution imaging. With an electronic noise of about 110 eV r.m.s., it opens new perspectives for many synchrotron applications where currently the detector is the limiting factor, e.g. inelastic X-ray scattering, Laue diffraction and soft X-ray or high-resolution color imaging. Due to the small pixel pitch, the charge cloud generated by absorbed X-rays is shared between neighboring pixels for most of the photons. Therefore, at low photon fluxes, interpolation algorithms can be applied to determine the absorption position of each photon with a resolution of the order of 1 µm. In this work, the characterization results of one of the MÖNCH prototypes are presented under low-flux conditions. A custom interpolation algorithm is described and applied to the data to obtain high-resolution images. Images obtained in grating interferometry experiments without the use of the absorption grating G2 are shown and discussed. Perspectives for the future developments of the MÖNCH detector are also presented.