Kossel interferences of proton-induced X-ray emission lines in periodic multilayers

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• 作者：Meiyi Wu (吴梅忆)^a ; ^b ; Karine Le Guen^a ; ^b ; Jean-Michel André ; ^a ; ^b ; Vita Ilakovac^a ; ^b ; ^c ; Ian Vickridge^d ; ^e ; Didier Schmaus^d ; ^e ; ^f ; Emrick Briand^d ; ^e ; Sé ; bastien Steydli^d ; Catherine Burcklen^g ; Franç ; oise Bridou^g ; Evgueni Meltchakov^g ; Sé ; bastien de Rossi^g ; Franck Delmotte^g ; Philippe Jonnard^a ; ^b ; ^{philippe.jonnard@upmc.fr" class="auth_mail" title="E-mail the corresponding author}
• 关键词：PIXE ; Periodic multilayer ; Kossel line
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：2016
• 出版时间：1 November 2016
• 年：2016
• 卷：386
• 期：Complete
• 页码：39-43
• 全文大小：762 K

文摘

The Kossel interferences generated by characteristic X-ray lines produced inside a periodic multilayer have been observed upon proton irradiation, by submitting a Cr/B₄C/Sc multilayer stack to 2 MeV protons and observing the intensity of the Sc and Cr Kα characteristic emissions as a function of the detection angle. When this angle is close to the Bragg angle corresponding to the emission wavelength and period of the multilayer, an oscillation of the measured intensity is detected. The results are in good agreement with a model based on the reciprocity theorem. The combination of the Kossel measurements and their simulation, will be a useful tool to obtain a good description of the multilayer stack and thus to study nanometer-thick layers and their interfaces.