Pseudo-sample based contribution plots: innovative tools for fault diagnosis in kernel-based batch process monitoring
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- 作者：Raffaele Vitalea ; rvitale86@gmail.com" class="auth_mail" title="E-mail the corresponding author ; Onno E. de Noordb ; Alberto Ferrera
- 关键词：Kernel-based techniques ; Batch process monitoring ; Pseudo-sample projection ; Contribution plots ; Fault detection ; Fault diagnosis
- 刊名：Chemometrics and Intelligent Laboratory Systems
- 出版年：2015
- 出版时间：15 December 2015
- 年：2015
- 卷：149
- 期：part_PB
- 页码：40-52
- 全文大小：1415 K
文摘
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This article explores the potential of Kernel-Principal Component Analysis (K-PCA) for batch process monitoring
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The idea of pseudo-sample projection is exploited for diagnostic purposes
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The proposed approach is found to enable a better fault diagnosis than bilinear ones when dealing with non-linear batch data
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It may also represent a valid alternative to model batch processes, whose physics and/or chemistry are not completely known