Thin film deposition of double perovskite oxides for multilayer device applications

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• 作者：A. H. Johnson^a ; ^{alexanne.johnson@gmail.com} ; P. Morris^a ; R. Ricciardo^b ; P.M. Woodward^b
• 关键词：Multilayers ; X-ray diffraction ; Atomic force microscopy ; Rutherford backscattering ; Transmission electron microscopy
• 刊名：Thin Solid Films
• 出版年：2017
• 出版时间：31 January 2017
• 年：2017
• 卷：622
• 期：Complete
• 页码：48-55
• 全文大小：1766 K
• 卷排序：622

文摘

Novel, insulating, buffer materials were grown as thin films. Lattice parameter, surface roughness, and stoichiometry were analyzed. Off-stoichiometry and structural defects were proposed, confirmed, and discussed.