Understanding industrial safety: Comparing Fault tree, Bayesian network, and FRAM approaches

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• 作者：Doug Smith ; Brian Veitch ; Faisal Khan ; ^{fikhan@mun.ca} ; Rocky Taylor
• 关键词：FRAM ; Bayesian network ; Accident modeling ; Fault tree analysis ; Safety analysis
• 刊名：Journal of Loss Prevention in the Process Industries
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：45
• 期：Complete
• 页码：88-101
• 全文大小：1407 K
• 卷排序：45

文摘

Comparison of accident modeling approaches. Application of FRAM approach to model industrial accident. A new functional link between safety and accident analysis.