Review on the development of cryogenic silicon detectors
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文摘
In this paper, we report on the performance of heavily irradiated silicon detectors operated at cryogenic temperatures. The results discussed here show that cryogenic operation indeed represents a reliable method to increase the radiation tolerance of standard silicon detectors by more than one order of magnitude. In particular, a 400μm thick “double-p” silicon detector irradiated up to 1&times;10<sup>15sup>n/cm<sup>2sup> delivers a mip signal of about 27000 electrons when operated at 130K and 500V bias. The position resolution of an irradiated microstrip detector, and “in situ” irradiation of a pad detector during operation in the cold are also discussed.

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