Characterization of copper SERS-active substrates prepared by electrochemical deposition

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• 作者：Jitka Cejkova ; Vadym Prokopec ; Sona Brazdova ; Alzbeta Kokaislova ; Pavel Matejka ; Frantisek Stepanek
• 关键词：Surface Enhanced Raman Scattering (SERS) ; Atomic Force Microscopy (AFM) ; Scanning Electron Microscopy (SEM) ; Copper ; Electrochemical deposition
• 刊名：Applied Surface Science
• 出版年：2009
• 出版时间：30 June 2009
• 年：2009
• 卷：255
• 期：18
• 页码：7864-7870
• 全文大小：423 K

文摘

Surface Enhanced Raman Scattering (SERS) on copper substrates of various morphologies, prepared by electrochemical deposition on platinum targets, was investigated. The substrate preparation procedures differed by the coating bath compositions, applied current densities and the duration of individual steps. The surface morphology of the substrates was visualized by means of Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM). SERS spectra of selected organic thiols were measured and the relation between SERS spectral intensity and the surface structure of SERS-active substrates was studied. It has been shown that good Raman surface enhancement can be achieved on the copper substrates prepared by electrochemical deposition from ammoniac baths. Copper substrates fabricated from acidic baths did not show efficient Raman surface enhancement. The results of microscopic measurements demonstrated that the average surface roughness value does not play a substantial role, whereas the shape of the surface nanostructures is a key parameter.