Dielectric properties investigation of Cu₂O/ZnO heterojunction thin films by electrodeposition

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• 作者：Qiang Li ; ^{jerrylee57318@hotmail.com} ; Mengmeng Xu ; Huiqing Fan ; Hairong Wang ; Biaolin Peng ; Changbai Long ; Yuchun Zhai
• 关键词：Cu2O/ZnO heterojunction ; Nanostructures ; Dielectric properties
• 刊名：Materials Science and Engineering: B
• 出版年：2013
• 出版时间：1 May, 2013
• 年：2013
• 卷：178
• 期：8
• 页码：496-501
• 全文大小：1087 K

文摘

Structures and morphologies of the Cu₂O/ZnO heterojunction electrodeposited on indium tin oxide (ITO) flexible substrate (polyethylene terephthalate-PET) were investigated by X-ray diffraction (XRD), scanning electronic microscopy (SEM), high resolution transmission electron microscopy (HRTEM), respectively. The dielectric response of bottom-up self-assembly Cu₂O/ZnO heterojunction was investigated. The low frequency dielectric dispersion (LFDD) was observed. The universal dielectric response (UDR) was used to investigate the frequency dependence of dielectric response for Cu₂O/ZnO heterojunction, which was attributed to the long range and the short range hopping charge carriers at the low frequency and the high frequency region, respectively.