The potential of multivariate analysis to phase identification based on X-ray diffraction patterns
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- 作者：G. Balcerowska-Czerniaka ; grazyna.czerniak@utp.edu.pl" class="auth_mail ; A. Wronkowskia ; A.J. Anto艅czakb ; 艁. Skowro艅skia ; A.A. Wronkowskaa
- 关键词：X-ray diffraction ; Compositional analysis ; PCA biplot ; Au&ndash ; Sn intermetallic compounds ; Laser-induced titanium oxides
- 刊名：Chemometrics and Intelligent Laboratory Systems
- 出版年：15 July 2014
- 年：2014
- 卷：135
- 期：Complete
- 页码：126-132
- 全文大小：904 K
文摘
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A method of chemical compounds identification using multivariate statistical data analysis based on X-ray diffractograms is proposed.
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The PCA biplot was utilised for a purpose of comparing the experimental diffraction fingerprints of the samples.
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The method is proven to be an efficient tool in the analysis of a multicomponet system.