Development of splitting convergent beam electron diffraction (SCBED)
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- 作者：Florent Houdelliera ; Florent.Houdellier@cemes.fr" class="auth_mail" title="E-mail the corresponding author ; Falk Rö ; dera ; b ; Etienne Snoecka
- 关键词：Electron optic ; Electron holography ; Electron diffraction ; Strain measurement
- 刊名：Ultramicroscopy
- 出版年：2015
- 出版时间：December 2015
- 年：2015
- 卷：159
- 期：part_P1
- 页码：59-66
- 全文大小：1878 K
文摘
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Using a condenser biprism, we split the CBED pattern in two half-CBED disks.
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We have determined the electron optical conditions used to perform various SCBED.
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We propose new applications possible for this new SCBED configuration