A novel method for surface defect inspection of optic cable with short-wave infrared illuminance
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- 作者：Xiaohong Chen ; Ning Liu ; coolboy006@sohu.com" class="auth_mail" title="E-mail the corresponding author ; Bo You ; Bin Xiao
- 关键词：Defects inspection ; Optic cable ; Image processing ; Infrared illuminance
- 刊名：Infrared Physics & Technology
- 出版年：2016
- 出版时间：July 2016
- 年：2016
- 卷：77
- 期：Complete
- 页码：456-463
- 全文大小：1486 K
文摘
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Novel method for surface defect inspection of optic cable.
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Implemented in the short-wave infrared illuminance.
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Effective on edge processing.
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Fast calculation speed of processing.
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Threshold window for the interaction framework.