Segregation anisotropy of Sn on different crystallographic orientation surfaces of coarse-grained Zircaloy-4
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文摘
X-ray photoelectron spectroscopy (XPS) technique was utilized to study the correlation between the tendency of Sn surface segregation and the crystallographic orientation of grain surface in coarse-grained (0.2–0.8 mm in diameter) Zircaloy-4 specimen. The results indicated that the intensity of Sn surface segregation was in an order of class="mathmlsrc">title="View the MathML source" class="mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0169433215030032&_mathId=si1.gif&_user=111111111&_pii=S0169433215030032&_rdoc=1&_issn=01694332&md5=c6119043f29b527f1626663cccb97cf6">class="imgLazyJSB inlineImage" height="17" width="181" alt="View the MathML source" title="View the MathML source" src="/sd/grey_pxl.gif" data-inlimgeid="1-s2.0-S0169433215030032-si1.gif">class="mathContainer hidden">class="mathCode">(0001)<(1¯21¯0)(011¯0), and it was in agreement with the prediction from bond-breaking theory.

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