A comparison of fatigue strength sensitivity to defects for materials manufactured by AM or traditional processes
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The scatter of fatigue strength for AM materials is reduced if data are correlated to the defect size at failure origin.

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class="mathmlsrc">class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0142112316301645&_mathId=si2.gif&_user=111111111&_pii=S0142112316301645&_rdoc=1&_issn=01421123&md5=f4b9caa5602761c46f322c927caf575b" title="Click to view the MathML source">Δσwclass="mathContainer hidden">class="mathCode">Δσw for AlSi10Mg and Ti6Al4V obtained by AM are similar to the properties for traditional processes.

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class="mathmlsrc">class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0142112316301645&_mathId=si3.gif&_user=111111111&_pii=S0142112316301645&_rdoc=1&_issn=01421123&md5=7a5ddf24e20f7bfe49eedc897e821042" title="Click to view the MathML source">ΔKthclass="mathContainer hidden">class="mathCode">ΔKth for small cracks and class="mathmlsrc">class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0142112316301645&_mathId=si2.gif&_user=111111111&_pii=S0142112316301645&_rdoc=1&_issn=01421123&md5=f4b9caa5602761c46f322c927caf575b" title="Click to view the MathML source">Δσwclass="mathContainer hidden">class="mathCode">Δσw show a significant increase, after HT or HIP, respect to the AB condition.

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