Germanium nitride and oxynitride films for surface passivation of Ge radiation detectors
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A surface passivation method for HPGe radiation detectors is proposed.

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Highly insulating GeNx- and GeOxNy-based layers are deposited at room temperature.

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Deposition parameters affect composition and electrical properties of the layers.

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The improved performance of a GeNx-coated HPGe diode is assessed.

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