Improved Interference configuration for structured illumination microscopy
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- 作者：Houkai Chena ; Shibiao Weia ; Xiaojing Wub ; Yong Yangc ; Yuquan Zhanga ; Luping Dua ; Jun Liub ; cjr.liujun@vip.163.com" class="auth_mail" title="E-mail the corresponding author ; Siwei Zhub ; Xiaocong Yuana ; xcyuan@szu.edu.cn" class="auth_mail" title="E-mail the corresponding author
- 关键词：Structured illumination ; Super-resolution ; Interference microscopy
- 刊名：Optics Communications
- 出版年：2017
- 出版时间：1 February 2017
- 年：2017
- 卷：384
- 期：Complete
- 页码：59-64
- 全文大小：824 K
文摘
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We present an improved interference configuration for structured illumination microscopy (SIM).
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The controlling of the patterned fringes (evanescent wave interference or spatial wave interference) is easier and this will help simply the optical system.
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The configuration is applied in the standing-wave evanescent illumination imaging. The method also has the potential value of 3D imaging.