Cu content dependence of morphological, structural and optical properties for Cu2ZnGeS4 thin films synthesized by sulfurization of sputtered precursors
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- 作者：Ling Huanga ; Hongmei Dengb ; Jun Hea ; Xiankuan Menga ; Jiahua Taoa ; Huiyi Caoa ; Lin Suna ; Pingxiong Yanga ; pxyang@ee.ecnu.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Junhao Chua
- 关键词：Cu2ZnGeS4 ; Cu content ; Sputtering ; Thin films
- 刊名：Materials Letters
- 出版年：2015
- 出版时间：15 November 2015
- 年：2015
- 卷：159
- 期：Complete
- 页码：1-4
- 全文大小：1489 K
文摘
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CZGS films with different Cu contents were prepared by sputtering method.
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Cu-rich films exhibit large grain size compared to those of Cu-poor films.
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Square resistance decrease from 14.2 to 1.3 k惟/鈻?with increasing grain size.
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Band gaps of the films decrease from 1.97 eV to 1.80 eV as Cu content increases.
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Reason for diverse values of Eg of CZGS based on the band theory is discussed.