Shading-induced failure in thin-film photovoltaic modules: Electrothermal simulation with nonuniformities
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- 作者：M. Nardone ; marcon@bgsu.edu" class="auth_mail" title="E-mail the corresponding author ; S. Dahal ; J.M. Waddle
- 关键词：Numerical simulation ; Reverse bias breakdown ; Degradation ; Monolithic modules ; Cu(In ; Ga) Se
- 刊名：Solar Energy
- 出版年：2016
- 出版时间：1 December 2016
- 年：2016
- 卷：139
- 期：Complete
- 页码：381-388
- 全文大小：1556 K
文摘
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A method for electrothermal simulation of monolithic thin-film modules is described.
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Low reverse breakdown spots in CIGS modules carry significant current when shaded.
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Thermal runaway leads to a breakdown event and permanent damage.
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Ohmic shunts result in excessive module heating and power loss.