Phase pure Gd2O3 doped KNN thin films deposited using RF magnetron sputtering.
Dispersion in the refractive index of the films was analyzed using single-oscillator model.
Nonlinear optical response of the films are measured by modified Zscan method.
Large third order optical nonlinearity is obtained for pure O2 plasma film.
Microwave dielectric properties of the films are measured using SPDR technique.