Single-cell analysis of the disruption of bacteria with a high-pressure jet device: An application of atomic force microscopy
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- 作者：Li Xie s139406t@st.go.tuat.ac.jp" class="auth_mail" title="E-mail the corresponding author ; Qian Bao s150207x@st.go.tuat.ac.jp" class="auth_mail" title="E-mail the corresponding author ; Akihiko Terada ; akte@cc.tuat.ac.jp" class="auth_mail" title="E-mail the corresponding author ; Masaaki Hosomi hosomi@cc.tuat.ac.jp" class="auth_mail" title="E-mail the corresponding author
- 关键词：Excess activated sludge reduction ; High-pressure jet device ; Cell disruption ; Atomic force microscopy ; Morphology ; Released intercellular substances
- 刊名：Chemical Engineering Journal
- 出版年：2016
- 出版时间：15 December 2016
- 年：2016
- 卷：306
- 期：Complete
- 页码：1099-1108
- 全文大小：2100 K
文摘
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Elucidated the mechanism of bacterial cell disruption by high-pressure jet device.
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Distinct patterns of cell damage observed for E. coli and B. subtilis.
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B. subtilis cells were destroyed by cell deflection of their membranes.
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E. coli cells were destroyed by cleavage, apiculus damage and surface deflections.
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Atomic force microscopy used to evaluate bacterial structural integrity.