Ge dots formation using Si(100)-c(4×4) surface reconstruction
详细信息    查看全文
文摘
class="listitem" id="list_li0005">
class="label">•

Effect of carbon coverage, Ge thickness and growth temperature on Ge dots formation was investigated.

class="label">•

Small and dense dots were formed at the carbon coverage of 0.25 ML.

class="label">•

Dot density of about 1.8×1010 cm−2 was achieved for Ge thickness and temperature of 4 nm and 400 ˚C, respectively.

class="label">•

Standard deviation of dot diameter was the lowest of 12 nm at Ge=4 nm.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700