Run-sum control charts for monitoring the coefficient of variation
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We develop the run sum charts for monitoring the coefficient of variation (CV).

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The CV is successfully applied in various scientific and societal disciplines.

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The ARL, SDRL and EARL formulae are derived through a Markov chain approach.

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Optimal designs are based on the deterministic and unknown shift-size conditions.

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New optimal charts’ parameters under the zero- and steady-state modes are given.

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