Gallium ion irradiation induced compaction and hardening of sputter deposited amorphous carbon thin films
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We examine behavior of amorphous carbon under 30 keV gallium ion irradiation.

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A surface depression and material compaction upon irradiation was observed.

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A material stiffening was observed and correlated to surface morphology measurements.

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The changed material properties were traced to altered bonding configuration by Raman spectroscopy measurements.

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Physical understanding is based on a detailed discussion of material stresses.

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