Advanced electron holography techniques for in situ observation of solid-state lithium ion conductors

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• 作者：Tsukasa Hirayama<sup>asup><sup> ; sup><sup>t-hirayama@jfcc.or.jpsup> ; Yuka Aizawa<sup>asup><sup> ; sup><sup>1sup> ; Kazuo Yamamoto<sup>asup> ; Takeshi Sato<sup>asup><sup> ; sup><sup>1sup> ; Hidekazu Murata<sup>bsup> ; Ryuji Yoshida<sup>asup> ; Craig A.J. Fisher<sup>asup> ; Takehisa Kato<sup>csup><sup> ; sup><sup>2sup> ; Yasutoshi Iriyama<sup>csup>
• 关键词：Electron holography ; Lithium ion conductor ; Electric-field leakage ; 3D-boundary-charge method ; Focused ion beam damage layers ; Chemical stability in air
• 刊名：Ultramicroscopy
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：173
• 期：Complete
• 页码：64-70
• 全文大小：796 K
• 卷排序：173

文摘

Phase distributions derived by comparing experimental and simulated measurements. Simulations take into account leakage electric fields. Electric potential distributions inside Li-ion conductors are obtained. FIB damage layers are removed using a low-energy narrow Ar ion beam. An air-tight biasing TEM holder for protecting air-sensitive specimens is reported.