Creep behavior evaluation and characterization of SiC film with Cr interlayer deposited by HiPIMS in Ti-6Al-4V alloy

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• 作者：Tarcila Sugahara^a ; ^{tarcilasugahara@yahoo.com.br} ; Gislene Valdete Martins^b ; Fabiano Emmanuel Montoro^c ; Abrã ; o Merij Neto^a ; Marcos Massi^a ; ^d ; Argemiro Soares da Silva Sobrinho^b ; Danieli Aparecida Pereira Reis^a ; ^b
• 关键词：SiC ; Ti-6Al-4V ; HiPIMS ; Microstructural characterization ; Creep
• 刊名：Surface and Coatings Technology
• 出版年：2017
• 出版时间：15 January 2017
• 年：2017
• 卷：309
• 期：Complete
• 页码：410-416
• 全文大小：2342 K
• 卷排序：309

文摘

SiC/Cr films were successfully deposited by HiPIMS in Ti–6Al–4V. The SiC/Cr film was well adhered and their surface morphology is a particles aggregate of into columnar shape. Creep tests showed that SiC/Cr film improved Ti-6Al-4V creep lifetime. SEM images after creep tests revealed ductile fracture mode.