Locating light and heavy atomic column positions with picometer precision using ISTEM

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• 作者：K.H.W. van den Bos^a ; F.F. Krause^b ; A. Bé ; ché ; ^a ; J. Verbeeck^a ; A. Rosenauer^b ; S. Van Aert^a ; ^{sandra.vanaert@uantwerpen.be}
• 关键词：High-resolution (scanning) transmission electron microscopy (HR (S)TEM) ; Imaging STEM (ISTEM) ; Quantitative electron microscopy ; Statistical parameter estimation theory ; Precise determination of atomic column locations
• 刊名：Ultramicroscopy
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：172
• 期：Complete
• 页码：75-81
• 全文大小：1958 K
• 卷排序：172

文摘

A statistical method is used to measure atomic column positions. Light and heavy columns are located with picometer precision using ISTEM images. A quantitative comparison is made between ISTEM and HAADF STEM imaging.