Synchrotron X-ray microdiffraction of Fe-3 wt%Si steel focusing on sub-boundaries within Goss grains

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• 作者：Hyung-Seok Shim^a ; Tae-Wook Na^a ; Jin-Seok Chung^b ; Soo-Bin Kwon^a ; Kyehwan Gil^c ; Jong-Tae Park^d ; Nong-Moon Hwang^a ; ^{nmhwang@snu.ac.kr" class="auth_mail" title="E-mail the corresponding author}
• 关键词：Abnormal grain growth ; Secondary recrystallization ; Synchrotron X-ray microdiffraction ; Dislocation boundaries
• 刊名：Scripta Materialia
• 出版年：2016
• 出版时间：15 April 2016
• 年：2016
• 卷：116
• 期：Complete
• 页码：71-75
• 全文大小：765 K

文摘

The microstructure evolved after the initial stage of abnormal grain growth (AGG) in Fe–3 wt%Si steel was examined using synchrotron X-ray microdiffraction to identify the sub-boundaries, which had been suggested to induce the selective AGG of Goss-oriented grains. The splitting of Laue diffraction peaks caused by sub-boundaries was observed only in Goss grains and not in matrix grains in the entire samples. The sub-boundaries were measured to have very low misorientation angles in the range of 0.1–0.6°. The characteristics and morphologies of sub-boundaries in Goss grains were analyzed based on the splitting directions and positions of Laue diffraction peaks.