Microstructure Development and Lateral Distribution of Defects in Ultra-fine Grained Copper Prepared by High-pressure Torsion

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• 作者：Ivan Proch¨¢zka ; Jakub ?¨ª?ek ; Oksana Melikhova ; Zuzana Barnovsk¨¢ ; Milo? Jane?ek ; Ond?ej Srba ; Radom¨ªr Ku?el ; Sergej V. Dobatkin
• 关键词：Ultra-fine grained copper ; high-pressure torsion ; lateral distribution of defects ; dislocations ; microvoids ; positron annihilation spectroscopy
• 刊名：Physics Procedia
• 出版年：2012
• 出版时间：2012
• 年：2012
• 卷：35
• 期：Complete
• 页码：4-9
• 全文大小：981 K

文摘

A defect study of ultra-fine grained (UFG) Cu prepared by high-pressure torsion (HPT) will be reported. Conventional positron annihilation spectroscopy (PAS) including positron lifetime (PLT) and Doppler broadening (DB) techniques was employed as the main experimental tool. PAS was combined with transmission electron microscopy, X-ray diffraction and Vickers microhardness (HV) measurements. First, lattice defects introduced by HPT were characterized. A very high concentration of defects created during HPT deformation was observed and the two kinds of defects could be identified: dislocations and small vacancy clusters (microvoids). Further investigations were focused on (i) the radial distributions of defects and (ii) the evolution of microstructure during HPT processing. The results of the present study are consistent with an increase of shear strain from the sample centre toward its periphery. Extended lateral mapping of microstructure was performed using HV and DB techniques. The latter one reveals a significant non-uniformity of defect distribution which was less pronounced in the HV measurements.