The structure of ionically conductive chalcogenide glasses: a combined NMR, XPS and ab initio calculation study
详细信息    查看全文
文摘
This paper reports on the structural investigation of lithium and sodium thiosilicate crystals and glasses by means of X-ray photoelectron spectroscopy and ab initio calculation. The results are analysed in conjunction with previously reported 29Si NMR data. While NMR proved to be an effective tool for the quantitative discrimination of edge- and corner-sharing tetrahedra existing in these materials, X-ray photoelectron spectroscopy (XPS) gives information on the nature of SiS bonds, i.e. bridging and non-bridging bonds. The main result is the noticeable difference existing between the structures of lithium and sodium thiosilicate glasses, which, according to XPS data, is due to different electronic redistributions over the network when one or the other alkali is added, the sodium addition resulting in a change in the electronic distribution over the entire network.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700