Influence of substrate temperature and overlap condition on the evaporation behavior of inkjet-printed semiconductor layers in organic thin film transistors
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- 作者：Byung Ju Kang ; Je Hoon Oh ; jehoon@hanyang.ac.kr" class="auth_mail" title="E-mail the corresponding author
- 关键词：Inkjet printing ; Organic thin film transistor ; 6 ; 13-Bis(triisopropylsilylethynyl) pentacene ; Evaporation behavior ; Crystalline structure
- 刊名：Thin Solid Films
- 出版年：2016
- 出版时间：1 January 2016
- 年：2016
- 卷：598
- 期：Complete
- 页码：219-225
- 全文大小：1874 K
文摘
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Crystal structure of inkjet-printed semiconductor layers was controlled.
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Crystal growth is determined by evaporation behavior of drying semiconductor layers.
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The evaporation behavior is affected by overlap condition and substrate temperature.
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Well-oriented crystal structure can be obtained by uniform contact line movement.
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OTFTs with well-oriented crystal structures show good electrical performance.