Polarization and spatial-mode behavior of short-wavelength VCSELs
详细信息    查看全文
文摘
We have investigated the packaging introduced feedback and resulting variations in the characteristics of Vertical-cavity surface-emitting lasers (VCSELs). An integrated test and characterization method was developed for both the packaged and bare dies as well as on-wafers chips. Using an ‘integrated test bench (ITB)’ for characterization, packaged and ‘un-packaged’ VCSELs from multiple sources were studied. ITB was used to monitor and measure simultaneously several beam-parameters under various bias conditions including both dc and high-speed pulsed pumping at room-temperature, or at higher-/lower-temperatures that are thermo-electrically controlled. Typical beam parameters included state of polarization (SOP), transverse (spatial) modes, wavelength spectra, and output power. A common observation was that majority of devices are affected by the presence of optical windows capping the package. A shift in longitudinal mode was noticeable in packaged versus ‘un-packaged’ (window-removed) devices. But, SOP and transverse modes in various devices are affected severely and in an unpredictable fashion.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700