MnTe and ZnTe grown on sapphire by molecular beam epitaxy

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• 作者：E. Przeź ; dziecka ; E. Dynowska ; W. Paszkowicz ; W. Dobrowolski ; H. Kę ; pa ; C.F. Majkrzak ; T.M. Giebultowicz ; E. Janik ; J. Kossut
• 关键词：MBE ; II– ; VI materials ; Crystal structure
• 刊名：Thin Solid Films
• 出版年：2008
• 出版时间：2 June 2008
• 年：2008
• 卷：516
• 期：15
• 页码：4813-4818
• 全文大小：484 K

文摘

We report on growth of MnTe layers by molecular beam epitaxy on Al₂O₃ substrates and of ZnTe layers on hybrid MnTe/Al₂O₃ substrates. The aim of our work was to prepare hexagonal phases of epitaxial thin films of these two materials. In the case of MnTe, the hexagonal NiAs-type phase was prepared by depositing the film directly on Al₂O₃ substrates. On the other hand, the crystal structure of ZnTe layers grown on hybrid MnTe/Al₂O₃ substrates was found to depend on the layer thickness: layers thinner than 0.05 μm grew in a metastable hexagonal wurtzite structure, but with further increases of the thickness, the cubic zinc blende phase of ZnTe tended to appear. The structural properties of MnTe and ZnTe layers were characterized by high energy electron and X-ray diffraction methods. Electrical properties of MnTe films were assessed by the Hall effect measurements. The topography and microstructure were analyzed by atomic force microscope. The Néel temperature and magnetic domains structure of antiferromagnetic hexagonal MnTe layers were obtained from neutron experiments.