Creation of MnAs nanoclusters during processing of GaMnAs

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• 作者：J. Bak-Misiuk ; J.Z. Domagala ; P. Romanowski ; E. Dynowska ; E. Lusakowska ; A. Misiuk ; W. Paszkowicz ; J. Sadowski ; A. Barcz ; W. Caliebe
• 关键词：Thin layer ; GaMnAs ; X-ray diffraction ; Strain ; Nanocluster ; Annealing ; High pressure
• 刊名：Radiation Physics and Chemistry
• 出版年：2009
• 出版时间：October 2009
• 年：2009
• 卷：78
• 期：10, Supplement 1
• 页码：S116-S119
• 全文大小：275 K

文摘

GaMnAs layers on (0 0 1)-oriented GaAs substrates were grown by the molecular beam epitaxy (MBE) method. Structural properties of samples processed at up to 920 K under hydrostatic Ar pressure up to 1.1 GPa were investigated by X-ray, secondary ion mass spectroscopy and atomic force microscopy methods. The sign of strain (compressive or tensile) of the GaMnAs layers, related to a creation of MnAs nanoclusters, is found to be dependent on processing conditions and on primary structure defects, whereas it was independent of Mn concentration. An influence of the defects structure in as-grown samples on the strain state of processed GaMnAs layers is discussed.