X-ray characterization of catalytically grown ZnTe and ZnMgTe nanowires
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- 作者：E. Dynowska ; W. Szuszkiewicz ; J.Z. Domagala ; E. Janik ; A. Presz ; T. Wojtowicz ; G. Karczewski ; W. Caliebe
- 关键词：Nanowires ; ZnTe ; MBE technology ; X-ray diffraction ; Synchrotron radiation
- 刊名：Radiation Physics and Chemistry
- 出版年：2009
- 出版时间：October 2009
- 年：2009
- 卷：78
- 期：10, Supplement 1
- 页码：S120-S124
- 全文大小：755 K
文摘
This paper reports on the results of detailed X-ray diffraction studies of ZnTe and ZnMgTe nanowires grown by molecular beam epitaxy. As the aim of proper interpretation of the X-ray measurements of samples consisting of large number of nanowires we defined a virtual unit cell as an averaged one from all really existing cells in the large number of nanowires. The studies revealed that average structure of nanowires is characterized by a minor rhombohedral distortion. The occurrence of this distortion is attributed to the specific defect structure in the majority of nanowires.