Comparison of fracture toughness and fatigue crack growth behavior of as-deposited vs HIP EBM Ti-6Al-4V.
Microstructure (large scale EBSD) and defect (via tomography) characterization of as-deposited vs HIP EBM Ti-6Al-4V.
Orientation-, location-, and process (as-deposited vs. HIP)- dependence of properties related to microstructure and/or defect characterization.
Comparison of microstructure/properties obtained on the different generation of EBM machines.
Use of materials informatics techniques to correlate structure/property relationships.