Prognostics-based qualification of high-power white LEDs using Lévy process approach
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- 作者：Kam-Chuen Yunga ; wincokc.yung@polyu.edu.hk" class="auth_mail" title="E-mail the corresponding author ; Bo Suna ; b ; sunbo@buaa.edu.cn" class="auth_mail" title="E-mail the corresponding author ; bo.sun@polyu.edu.hk" class="auth_mail" title="E-mail the corresponding author ; Xiaopeng Jiangb ; jxpvision@buaa.edu.cn" class="auth_mail" title="E-mail the corresponding author
- 关键词：Light-emitting diodes ; Qualification ; prognostics ; Reliability ; Anomaly detection ; Lé ; vy process
- 刊名：Mechanical Systems and Signal Processing
- 出版年：2017
- 出版时间：1 January 2017
- 年：2017
- 卷：82
- 期：Complete
- 页码：206-216
- 全文大小：1193 K
文摘
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A prognostics-based reliability qualification approach for LEDs is proposed.
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A mixed Gamma and compound Poisson process is suitable for describing the actual degradation process of LEDs.
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The Gamma distribution is suitable for describing the random sporadic small jumps.
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This approach overcome the shortcomings of the IES-TM-21 method.
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This approach is helpful for reducing the total test time and cost required for batch LEDs.