Influence of the solar cells metallization firing treatment on carrier recombination and trapping in copper contaminated multicrystalline silicon: new insights into the role of the phosphorus-rich layers
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- 作者：Sé ; bastien Dubois ; sebastien.dubois@cea.fr" class="auth_mail" title="E-mail the corresponding author ; Tleuzhan Turmagambetov ; Jean-Paul Garandet ; Hé ; lè ; ne Lignier ; Nicolas Enjalbert
- 关键词：Silicon ; Multicrystalline ; Copper ; Light-induced degradation ; Recombination ; Trapping
- 刊名：Solar Energy Materials and Solar Cells
- 出版年：2016
- 出版时间：December 2016
- 年：2016
- 卷：157
- 期：Complete
- 页码：558-564
- 全文大小：1195 K
文摘
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P-emitters limit the dissolution of the Cu precipitates during the firing.
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The samples fired without emitters feature higher bulk carrier lifetime.
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Without emitters, the samples are sensitive to firing-activated LID effects.
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The firing generates trapping probably involving Cu atoms initially precipitated.
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A new procedure for determining the main cause of LID is proposed.