Significance of irreversible formation of ¡°electromer?in 1-bis[4-[N,N-di(4-tolyl)amino]phenyl]-cyclohexane layer associated with the stability of deep blue phosphorescent organic light emitting diodes

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• 作者：Soonnam Kwon ; Kyung-Ryang Wee ; Chyongjin Pac ; ^{jjpac@korea.ac.kr} ; Sang Ook Kang ; ^{sangok@korea.ac.kr}
• 关键词：Electromer ; Defect sites ; Stability ; Deep blue PHOLED
• 刊名：Organic Electronics
• 出版年：2012
• 出版时间：April, 2012
• 年：2012
• 卷：13
• 期：4
• 页码：645-651
• 全文大小：982 K

文摘

We demonstrate that injection of electrons in 1-bis[4-[N,N-di(4-tolyl)amino]phenyl]-cyclohexane (TAPC) layer irreversibly induces defect sites responsible for ¡°electromer?emission. We also show that the defects alter the charge transporting properties of TAPC layer to influence the charge balance of iridium(III)[bis(4,6-difluorophenyl)pyridinato-N,C^{2?/sup>]tetrakis(1-pyrazolyl)borate (FIr6) based deep blue phosphorescent organic light emitting diodes (PHOLED). The present investigation implies that deep-blue PHOLEDs should be carefully designed for the emission zone to be located far enough from the TAPC layer so as to avoid or minimize the emission from TAPC layer.}