An SEU resilient, SET filterable and cost effective latch in presence of PVT variations
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- 作者：Aibin Yana ; b ; abyan@mail.ustc.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Huaguo Liangc ; huagu1g@hfut.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Zhengfeng Huangc ; huangzhengfeng@139.com" class="auth_mail" title="E-mail the corresponding author ; Cuiyun Jiangd ; hgdyun@foxmail.com" class="auth_mail" title="E-mail the corresponding author ; Yiming Ouyangb ; oyymbox@163.com" class="auth_mail" title="E-mail the corresponding author ; Xuejun Lia ; xjli@ahu.edu.cn" class="auth_mail" title="E-mail the corresponding author
- 关键词：Transient fault ; Single event upset ; Single event transient ; Soft error ; Radiation hardening ; Circuit reliability
- 刊名：Microelectronics Reliability
- 出版年：2016
- 出版时间：August 2016
- 年：2016
- 卷：63
- 期：Complete
- 页码：239-250
- 全文大小：2019 K
文摘
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A single event upset resilient, single event transient tolerant latch is proposed.
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The latch mainly comprises a Schmitt trigger and two Muller C-elements.
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The latch is cost effective compared with most of the same type latches.
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The latch is equivalently or less sensitive to process and temperature variations.