Raman and far-infrared measurements of Cd1−xMnxGeAs2 samples (0 ≤ x ≤ 0.037) were done.
Defects optical phonons at about 125, 170 and 235 cm−1 were registered.
CdAs2 and Cd3As2 clusters and GeAs antisite defects are their most probably causes.
GeAs are connected to energy level at 200 meV and lattice tetragonal distortion.
Doping with small amount of Mn reduces the formation of antisite defects GeAs.