文摘
CZTS thin films were prepared using sequential sputtering followed by sulfurization. Examined the effect of stacking order on properties of CZTS films after sulfurization. Material losses and phase evolution during high temperature sulfurization depends on stacking sequence. The films were characterized by XRD, Raman, FE-SEM with EDS, XPS, UV–vis–NIR spectrophotometer and Electrical study. Raman mapping was collected to ensure uniformity of the CZTS thin film.