Evaluation of metal trace detachment from dosing pumps using PIXE

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• 作者：Omar Lozano^a ; ^{omar.lozanogarcia@unamur.be" class="auth_mail} ; Jorge Mejia^a ; Julie Laloy^b ; Lü ; tfiye Alpan^b ; Olivier Toussaint^c ; Jean-Michel Dogné ; ^b ; Sté ; phane Lucas^a
• 关键词：PIXE ; Dosing pump ; Ceramic ; Stainless steel ; Metal trace
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：15 July 2014
• 年：2014
• 卷：331
• 期：Complete
• 页码：117-120
• 全文大小：612 K

文摘

Metal trace detachment evaluation is essential for instruments destined for pharmaceutical applications, such as pumps. Particle-Induced X-ray Emission (PIXE) was used to determine and quantify metal traces originated from stainless steel and ceramic dosing pumps. Metal traces were quantified from either distilled water samples or cellulose filters in two tests: a short-term test of 16 h mimicking a daily cycle of a dosing pump for industrial applications, and a long-term test of 9 days evaluating the pump wearing. The main result is that ceramic dosing pumps present lower metal detachment than stainless steel counterparts. Traces of Si and Al were found originating from pieces around the pumps (pipes and joints).