A 72% error reduction scheme based on temperature acceleration for long-term data storage applications: Cold flash and millennium memories
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- 作者：Senju Yamazaki ; Tomoko Ogura Iwasaki ; Shogo Hachiya ; Tomonori Takahashi ; takahashi@takeuchi-lab.org" class="auth_mail" title="E-mail the corresponding author ; Ken Takeuchi
- 关键词：Solid-state drive ; SSD ; NAND flash memory ; Data archive ; Cold flash
- 刊名：Solid State Electronics
- 出版年：2016
- 出版时间：July 2016
- 年：2016
- 卷：121
- 期：Complete
- 页码：25-33
- 全文大小：1626 K
文摘
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Flexible-nLC scheme is proposed for long-term storage applications.
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This paper investigates the optimal coding scheme for different conditions.
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The experiment results show that the temperature dependence exists in retention time.
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The activation energy with different W/E cycles and ECC is also investigated.