High-pressure synchrotron Mössbauer and X-ray diffraction studies: Exploring the structure-related valence fluctuation in EuNi₂P₂

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• 作者：Chunyu Li^a ; ^b ; Zhenhai Yu^a ; ^b ; ^{yuzh@hpstar.ac.cn" class="auth_mail" title="E-mail the corresponding author} ; Wenli Bi^c ; ^d ; Jiyong Zhao^c ; Michael Y. Hu^c ; Jinggeng Zhao^b ; Wei Wu^e ; Jianlin Luo^e ; ^f ; Hao Yan^a ; ^{yanhao@hpstar.ac.cn" class="auth_mail" title="E-mail the corresponding author} ; Esen E. Alp^c ; Haozhe Liu^a ; ^b ; ^{haozhe.liu@hpstar.ac.cn" class="auth_mail" title="E-mail the corresponding author}
• 关键词：ThCr2Si2-type phosphides ; Structural stability ; Electronic phase transitions ; High-pressure
• 刊名：Physica B: Physics of Condensed Matter
• 出版年：2016
• 出版时间：15 November 2016
• 年：2016
• 卷：501
• 期：Complete
• 页码：101-105
• 全文大小：1000 K

文摘

The high-pressure effect on valence fluctuation of the ThCr₂Si₂-type intermetallic compound EuNi₂P₂ has been investigated using in situ synchrotron Mössbauer spectroscopy (SMS). The isomer shift of ¹⁵¹Eu in EuNi₂P₂ increases monotonically with increasing pressure up to 50 GPa, suggesting a valence transition of the Eu from mixed toward trivalent. The synchrotron angle-dispersive X-ray diffraction (AD-XRD) experiment shows that EuNi₂P₂ remains in the tetragonal structure up to 32.5 GPa at room temperature. We propose that the evolutions of bonding distance with pressure have an obvious effect on the valence fluctuation.