Nanosecond multi-pulse laser-induced damage mechanisms in pure and mixed oxide thin films
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- 作者：Frank R. Wagner ; frank.wagner@fresnel.fr" class="auth_mail" title="E-mail the corresponding author ; Cé ; line Gouldieff1 ; celine.gouldieff@univ-rennes1.fr" class="auth_mail" title="E-mail the corresponding author ; Jean-Yves Natoli jean-yves.natoli@fresnel.fr" class="auth_mail" title="E-mail the corresponding author ; Mireille Commandré ; mireille.commandre@fresnel.fr" class="auth_mail" title="E-mail the corresponding author
- 关键词：Laser-induced damage ; Nanosecond lasers ; Fatigue effect ; Ultraviolet ; Hafnia ; Silica ; Alumina ; Ion beam sputtered mixture coatings
- 刊名：Thin Solid Films
- 出版年：2015
- 出版时间：1 October 2015
- 年：2015
- 卷：592
- 期：part_PB
- 页码：225-231
- 全文大小：918 K
文摘
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Multi-pulse laser damage can be analyzed plotting damaging shot number vs. fluence.
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A fatigue effect was only observed for small laser beams, avoiding worse precursors.
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The fatigue behavior of a mixture cannot be interpolated from the pure oxides.
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SiO2 and Al2O3 damage at 266 nm is due to deterministic material modifications.
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Hafnia multi-pulse laser damage with small beams is stochastic even at 266 nm.