Structure and spectroscopic analysis of the graphene monolayer film directly grown on the quartz substrate via the HF-CVD technique
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- 作者：Waleed E. Mahmouda ; b ; w_e_mahmoud@yahoo.com" class="auth_mail" title="E-mail the corresponding author ; Farag S. Al-Hazmia ; A.A. Al-Ghamdia ; F.S. Shokrc ; Gary W. Bealla ; d ; Lyudmila M. Bronsteina ; e
- 关键词：Structure ; Growth ; Raman spectroscopy ; XPS ; Graphene ; Ellipsometry ; Optical constants
- 刊名：Superlattices and Microstructures
- 出版年：2016
- 出版时间：August 2016
- 年：2016
- 卷：96
- 期：Complete
- 页码：174-178
- 全文大小：1110 K
文摘
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Monolayer graphene film was grown directly on quartz substrate by hot filament CVD.
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Crystalline and free of defects monolayer graphene film was obtained.
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Ellipsometric spectroscopy was employed to estimate the optical constants of graphene.
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The optical dispersion was fitted by Forouhi-Bloomer and Wemple-Didomenico models.