Micro-structural characterization of annealed cadmium–zinc oxide thin films obtained by spray pyrolysis
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- 作者：Cruz-Gandarilla ; F. ; Morales-Acevedo ; Arturo ; Vigil ; O. ; Hesiquio-Garduñ ; o ; M. ; Vaillant ; L. ; et. al.
- 关键词：68.55 ; 78.66 ; Micro-structural characterization ; Cadmium&ndash ; zinc oxides ; Thin films ; Optical properties
- 刊名：Materials Chemistry and Physics
- 出版年：2003
- 出版时间：February 28, 2003
- 年：2003
- 卷：78
- 期：3
- 页码：840-846
- 全文大小：180 K
文摘
The structural properties of annealed (ZnO)x(CdO)1−x thin films are studied by x-ray diffraction methods. The films were obtained by spray pyrolysis using different values for the nominal composition (x), and then they were annealed at 450°C from 0 to 120min. The structural analysis confirms previous results on the formation of a homogeneously mixed oxide semiconductor, but in which crystalline and amorphous phases co-exist for both CdO and ZnO. In this work, we show that for annealed films there is a strong interaction between the amorphous, the hexagonal ZnO and the cubic CdO phases regarding the lattice constants and the crystallite growth rate. In the annealed films, for x≤0.5 the optical behavior is mainly controlled by the CdO phase, so that there is a reduction of the effective band-gap of the material when the CdO crystallite size is increased, possibly due to grain size effects. On the other hand, for x>0.5 the band-gap behavior is mainly determined by the variation of the ZnO crystallite lattice parameters and the relative volumetric concentration of amorphous and crystalline ZnO in the film.