Structural and microstructural characterization of Bi₂Te₃ films deposited by the close space vapor transport method using scanning electron microscopy and X-ray diffraction techniques

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• 作者：Francisco Cruz-Gandarilla ; ^{fcruz@esfm.ipn.mx} ; Osvaldo Vigil-Galá ; n ; Jose Gerardo Cabañ ; as-Moreno ; Jorge Sastré ; -Herná ; ndez ; Francois Roy¹
• 关键词：Close space vapor transport ; Bismuth telluride ; Crystal microstructure ; Texture ; Thermoelectric properties ; X-ray diffraction
• 刊名：Thin Solid Films
• 出版年：2012
• 出版时间：30 March, 2012
• 年：2012
• 卷：520
• 期：11
• 页码：3865-3870
• 全文大小：971 K

文摘

We report the structural and microstructural features of Bi₂Te₃ films deposited by close space vapor transport (CSVT) technique on soda-lime glass substrates.

Different phases are obtained depending on the substrate temperature, as well as changes in the thermoelectric properties of the CSVT-Bi₂Te₃ films. The relationship between the structural and electrical properties of the films is present.