Investigation on the simultaneous removal of fluoride, ammonia nitrogen and phosphate from semiconductor wastewater using chemical precipitation
详细信息 查看全文
- 作者：Haiming Huang ; Jiahui Liu ; Peng Zhang ; Dingding Zhang ; Faming Gao ; fmgao@ysu.edu.cn" class="auth_mail" title="E-mail the corresponding author
- 关键词：Ammonia nitrogen ; Phosphate ; Fluoride ; Struvite ; Semiconductor wastewater
- 刊名：Chemical Engineering Journal
- 出版年：2017
- 出版时间：1 January 2017
- 年：2017
- 卷：307
- 期：Complete
- 页码：696-706
- 全文大小：3047 K
文摘
- •
Treatment of semiconductor wastewater by chemical precipitation was investigated.
- •
Removal of fluoride by Mg2+ showed good performance.
- •
Fluoride ions exert a significant inhibitory effect on struvite crystallization.
- •
Bittern is suitable to treat semiconductor wastewater.
- •
PO4-P and F− can be efficiently removed using the two-stage precipitation process.