Enhanced Unlatch Operation of Disk Drive for Low Temperature Environment

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• 作者：Kyoung Whan Oh ; ^{kw208.oh@samsung.com" class="auth_mail" title="E-mail the corresponding author} ; Paul Lee ; Yong Won Choi
• 关键词：TRIZ ; HDD ; hard disk drive ; magnetic latch system ; unlatch operation ; parking Head
• 刊名：Procedia Engineering
• 出版年：2015
• 出版时间：2015
• 年：2015
• 卷：131
• 期：Complete
• 页码：906-913
• 全文大小：731 K

文摘

Hard disk drive was first introduced in 1956 by IBM with the appearance of IBM Model 350 disk storage, which was shipped IBM 305 RAMAC system [1]. Since then the capacity of hard drives has grown exponentially. When hard drives became available for personal computers, they were offered with 5 megabyte capacity. During the mid-1990s the typical hard disk drive for a PC had a capacity of about 1 gigabyte. As of January 2012, desktop hard disk drives typically had a capacity of 500 to 2000 gigabytes while the largest-capacity drives had up to 4 terabytes.

With the performance and capacity of HDDs reaching their peaks and technology advancing by day, HDD manufacturers now focus their strategy towards making preoccupancy in the market to induce greater profit. It is important to meet the product development stage deadline tightly and start mass-production early. More often than not, manufacturers face performance quality issues as the mass production approaches and it is very desirable that such issues are dealt without time-consuming mechanical and electronic hardware changes.

This paper proposes a method of enhancing unlatch performance of HDD at low temperature environment without hardware changes using TRIZ. Problem Analysis was used to break down and pinpoint the problematic area and Resource Analysis was used to find the solution. The solution utilizes already existent system resources and test results show no undesirable side effects, which makes the proposed method a cost-effective solution for mass-production stage or quality assurance stage just before the production.

With little affect in the life of related mechanical components, authors were able to reduce the number of defective drives from low temperature unlatch test by great difference.