GISAXS and TEM were used to measure nano-bubble formation in W exposed to He plasma in the large helical device.
Nano-bubbles had an exponential diameter distributions with averages 0.6 ± 0.1 nm and 0.68 ± 0.04 nm measured by GISAXS and TEM.
Nano-bubbles had an exponential depth distributions with average depths of 9.1 ± 0.4 nm and 8.4 ± 0.5 nm for GISAXS and TEM.
The GISAXS model used to analyse diffraction patterns is explained in detail.